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Education
B.S. Physics (1995), Binghamton University, Binghamton, NY
M.S. Materials Science and Engineering
(1997), Rochester Institute of
Technology, Rochester, NY
Ph.D. Imaging Science
(2007), Rochester Institute of Technology, Rochester,
NY
Industrial Background
2007 - Present Associate Scientist, Chester F. Carlson
Center for Imaging Science, RIT
2002 - 2007 Senior Scientist, Space Systems Division, ITT
Corporation
2001 - 2002 Senior Scientist, Commercial and Government
Systems, Eastman Kodak Company
2000 – 2001 Materials Engineer,
Precision Glass Molding, Eastman Kodak Company
1997 – 2000 Research
Scientist, Global Scientific Affairs,
Bausch & Lomb
Research Interests
Currently I am researching novel surface scattering models for
spectral-polarimetric signature prediction. The application of the modeling
is to aid in target detection, target phenomenology predictions for system
trade studies, as well as a general understanding of polarimetric reflection
and emission phenomenology.
I am also interested in modeling remote sensing
platforms at the system level to make image quality and general capability
assessments. The idea being that a better understanding of system performance
in the design phase will result in a better performing platform once in
operation.
Additionally I am working on a research project that is developing a capability
to simulate raw data collected from an antenna on a
Synthetic Aperture RADAR
collection platform. The challenge here is to work within a particle based
ray-tracing framework but capturing wave based phenomenology at material surfaces,
at the antenna level, and through the atmosphere.
Publications and Conference Proceedings
M. Gartley, Micro-scale surface modeling for radiometric exploitation, GEOINT 2009
Symposium, NURI/NARP Emerging Technologies Forum, San Antonio TX, Oct 21, 2009.
M. Gartley, W. Basener,
“Topological anomaly detection performance with multispectral
polarimetric imagery”,
Proceedings of the SPIE, v7334, Apr 2009.
E. Ientilluci, M. Gartley,
“Impact of BRDF on physics-based
modeling as applied to target detection in hyperspectral imagery”,
Proceedings of the SPIE, v7334, Apr 2009.
M. Gartley, J. Schott, S. Brown,
“Micro-scale
modeling of contaminant effects on surface optical properties”,
Proceedings of the SPIE, v7086-16, August 2008.
M. Gartley, S. Brown, J. Schott, “Micro-scale
Surface and Contaminate Modeling for Polarimetric Signature
Prediction”, Proceedings of the SPIE, Polarization: Measurement, Analysis, and Remote
Sensing VIII,
v6972-42, March 2008.
M. Gartley, S. Brown, J. Schott, N. Sanders, A. Goodenough, “Polarimetric Scene Modeling in the
Thermal Infrared”, Proceedings of the SPIE, Polarization Science and Remote Sensing III,
v6682-11, August 2007.
M. Gartley, “Contact lens surface characterization by
Atomic Force Microscopy”, presented at Surfaces in Biomaterials
conference, Phoenix 1999.
T. Bergstron, C. Brown, M. Gartley, T. Altshuler, "Evaluating systematic
measurement artifacts parallel and perpendicular to the scanning direction
using scale-sensitive fractal analysis" Scanning 99, Chicago, April
1999.
S.K. Gupta, M. Gartley, “XRD and VSM analysis of nanostructured Cu-Co alloys”,
Advances in X-ray Analysis, v41, p688-697, 1997.
M. Gartley, S. K. Gupta, “Experiments in Atomic Force Microscopy”,
Proceedings of ASEE Zone I Meeting, West Point, NY, plC3-l:lC3-4, Apr
1997.
M. Gartley, C. Nelson, “On
the two q-analogue logarithmic
functions’, J. Phys. A: Math Gen ,v29 p8099–8115, 1996.
M. Gartley, C. Nelson, “On the zeros of the q-analogue
exponential function”,
J. Phys. A: Math Gen, v27, p3857-3881, 1994.
Patents
US7147326, Lens with colored portion and coated
surface
, issued Dec 12,
2006.
US7021761, Lens with colored portion and coated surface, issued Apr 4,
2006.
US6467904, EP1307335, Method of making lens with
colored portion,
issued Oct
22, 2002.
US6248266, EP1307334, Method of making lens with colored
portion, issued June 19, 2001.
Links of Interest
Center for Imaging Science
Digital Imaging and Remote Sensing
DIRSIG
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