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Brent Bartlett
Research Details
- Research Interests
- Remote Sensing
Personal Information
- Contact Information
- Location: 76-3269 Office: (585) 475-5037 Fax: (585) 475-5988 Email: bdbpci@cis.rit.edu
- Title and Degrees
- IC Postdoctoral Researcher Ph.D., Rochester Institute of Technology, Imaging Science BS, SUNY Geneseo, Physics BA, SUNY Geneseo, Computer Science
History
- Member for
- 3 weeks 6 days
Publications
REFEREED JOURNAL ARTICLES
Bartlett, B.D.; Schott, J.R., Atmospheric compensation in the presence of clouds: an adaptive empirical line method (AELM) approach, Journal of Applied Remote Sensing, 3, 1 (2009) [BibTeX]
CONFERENCE PROCEEDINGS
Bartlett, B.D.; Devaraj, C.; Gartley, M.G.; Salvaggio, C.; Schott, J.R., Spectro-polarimetric BRDF determination of objects using in-scene calibration materials for polarimetric imagers, Proceedings of SPIE, SPIE Optics and Photonics, Polarization Science and Remote Sensing IV, Calibration, Compensation, and Optimization, 7461, San Diego, California, United States, pp. 74610T1-74610T11, August (2009) [BibTeX]
Arsenovic, M.V.; Salvaggio, C.; Garrett, A.J.; Bartlett, B.D.; Faulring, J.W.; Kremens, R.L.; Salvaggio, P.S., Use of remote sensing data to enhance the performance of a hydrodynamic simulation of a partially frozen power plant cooling lake, Proceedings of the SPIE, SPIE Defense and Security, Thermosense XXXI, Infrared Sensors and Systems, 7299, 10, Orlando, Florida, United States, April (2009) [BibTeX]
Bartlett, B.D.; Schott, J.R., Atmospheric inversion in the presence of clouds: an adaptive ELM approach, Proceedings of the SPIE, SPIE, Imaging Spectrometry XII, 6661, 1, San Diego, California, United States (2007) [BibTeX]
Bartlett, B.D.; Klempner, S.L.; Schott, J.R., Ground truth-based variability analysis of atmospheric inversion in the presence of clouds, Proceedings of the SPIE, SPIE, Atmospheric and Environmental Remote Sensing Data Processing and Utilization II: Perspective on Calibration/Validation Initiatives and Strategies, 6301, 1, San Diego, California, United States (2006) [BibTeX]
SEMINAR ABSTRACTS
Bartlett, B.D., Optical Tracking Algorithms for Applied Metrology, Chester F. Carlson Center for Imaging Science Seminar Series, February (2008) [BibTeX]
