(2 November 2009) CIS Students Participate in STEM Fair

CIS Students Participate in Science, Technology, Engineering, and Math (STEM) Fair

On Sunday, November 1st, three imaging science students, all alumni of Victor High School, returned home to participate in their district's bi-annual STEM (Science Technology, Engineering, and Math) Fair.  

The purpose of the fair, which was held for the first time in 2007, is to expose Victor students and their parents to career opportunities in technical fields.  This year's fair, which featured about 20 exhibits, started with a keynote address by Mr. Dick Kaplan, CEO of Pictometry and chairperson of the Center for Imaging Science Advisory Board.  

The three imaging science students, senior Dave Kelbe, junior Josh Zollweg, and freshman Colin Axel, spent the afternoon demonstrating the use of a thermal imaging camera, and talking to the attendees about RIT's imaging science program.

Pictures are available at http://picasaweb.google.com/RITImagingScience/2009VictorSTEMFair#