MCSL Summer Short Course 2008: Essentials of Color Science
June 3-6, 2008
Overview |  Course Outlines |  About the Instructors |  Download the 2008 brochure

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2008 INFORMATION


About the Instructors

Roy S. Berns
Roy Berns is the Richard S. Hunter Professor of Color Science, Appearance, and Technology at RIT. He received B.S. and M.S. degrees in Textile Science from the University of California at Davis and a Ph.D. in Chemistry with an emphasis on color science from Rensselaer Polytechnic Institute. Professor Berns teaches courses on applied colorimetry and color modeling and leads a research group in the area of spectral imaging, archiving, and reproduction of cultural heritage. He has been active in color tolerance measurements and equations and was a member of the CIE committees that developed CIE94 and CIEDE2000. He is the author of Billmeyer and Saltzman’s Principles of Color Technology, 3rd edition and numerous publications. He was presented with the Macbeth Award by the Inter-Society Color Council for his research on color science and leadership of color-science education. He is a Fellow of the Society of Imaging Science and Technology and the recipient of that society’s Journal Award. (homepage)

Mark D. Fairchild
Mark Fairchild is the Director of the Munsell Color Science Laboratory and Xerox Professor of Color Science at RIT. He received his B.S. and M.S. degrees in Imaging Science from RIT and his Ph.D. in Vision Science from the University of Rochester. Professor Fairchild teaches courses on colorimetry, color reproduction, and color appearance and performs research in the areas of image appearance, quality, perception, and rendering. He is the author of Color Appearance Models and numerous technical papers and presentation in a variety of areas of color science. He was presented with the Bartleson Award by the Colour Group (Great Britain) and the Macbeth Award by the Inter-Society Color Council for his research on color appearance. He is also a Fellow of the Society of Imaging Science and Technology. (homepage)

James Ferwerda
James A. Ferwerda is an Associate Professor in the Munsell Color Science Laboratory. He received a B.A. in Psychology (1980), M.S. in Computer Graphics (1987), and a Ph.D. in Experimental Psychology (1998), all from Cornell University. Professor Ferwerda teaches courses on imaging systems analysis, color measurement, and computational color science. Current research interests include high dynamic range imaging, perceptually-based image synthesis, perception of material properties, and low vision and assistive technologies. Prior to joining the Faculty at RIT he was a Research Associate in the Program of Computer Graphics at Cornell. In 1992 he received the IEEE Computer Society Paper of the Year Award, and in 2003 he was selected for the National Academy of Engineering Frontiers of Engineering Program. (homepage)

Mitchell R. Rosen
Mitchell Rosen is a Research Assistant Professor with the Munsell Color Science Laboratory and the Visual Perception Laboratory. He received a B.S. in Computer Science from Tufts University and a Ph.D. in Imaging Science from RIT. Dr. Rosen spent a decade in the research labs of Polaroid working on design and support of cameras, scanners, printers and color management systems. At RIT he teaches graduate courses on color systems and performs research in the areas of color management, spectral capture systems, spectral image processing, spectral rendering systems, and eye tracking. He is color imaging editor of the Journal of Imaging Science and Technology. (homepage)

David R. Wyble
Dave Wyble is a Color Scientist within the Munsell Color Science Laboratory. He received an M.S. from RIT and a Ph.D. from Chiba University, both in Color Science. He teaches the graduate color science Color Measurement Laboratory 1. He has taught graduate and undergraduate Imaging Science courses for the last 10 years. Dr. Wyble is active in the Inter-Society Color Council and the Council for Optical Radiation Measurements. His research interests are in color measurement instrumentation and device characterization techniques. (homepage)

Overview  |   Course Outlines  |   About the Instructors


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